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Journal Articles Microscopy and Microanalysis Year : 2016

Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem

L. Rigutti
I. Blum
W. Lefebvre
D. Blavette
F. Vurpillot
R. Butté

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hal-01954232 , version 1 (13-12-2018)

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L. Rigutti, L. Mancini, E. Di Russo, I. Blum, F. Moyon, et al.. Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem. Microscopy and Microanalysis, 2016, 22 (S3), pp.650-651. ⟨10.1017/S1431927616004104⟩. ⟨hal-01954232⟩
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