Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem - Université Côte d'Azur Access content directly
Journal Articles Microscopy and Microanalysis Year : 2016

Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem

Lorenzo Rigutti
Ivan Blum
Williams Lefebvre
Didier Blavette
François Vurpillot
R. Butté
L. Largeau

Dates and versions

hal-01954232 , version 1 (13-12-2018)

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Lorenzo Rigutti, L. Mancini, Enrico Di Russo, Ivan Blum, F. Moyon, et al.. Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem. Microscopy and Microanalysis, 2016, 22 (S3), pp.650-651. ⟨10.1017/S1431927616004104⟩. ⟨hal-01954232⟩
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