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Conference Papers Year : 2023

SMART: Selective MAC zero-optimzation for neural network reliability under radiation

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hal-04094354 , version 1 (10-05-2023)

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  • HAL Id : hal-04094354 , version 1

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Anuj Justus Rajappa, Philippe Reiter, Tarso Kraemer Sarzi Sartori, Luiz Henrique Laurini, Hassen Fourati, et al.. SMART: Selective MAC zero-optimzation for neural network reliability under radiation. ESREF 2023 - 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 2023, Toulouse, France. pp.1-4. ⟨hal-04094354⟩
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